This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Produkteigenschaften
- Artikelnummer: 9789811044328
- Medium: Buch
- ISBN: 978-981-10-4432-8
- Verlag: Springer Nature Singapore
- Erscheinungstermin: 06.10.2017
- Sprache(n): Englisch
- Auflage: 1. Auflage 2018
- Serie: SpringerBriefs in Applied Sciences and Technology
- Produktform: Kartoniert
- Gewicht: 2409 g
- Seiten: 137
- Format (B x H x T): 155 x 235 x 9 mm
- Ausgabetyp: Kein, Unbekannt