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Field Emission Scanning Electron Microscopy

New Perspectives for Materials Characterization

Medium: Buch
ISBN: 978-981-10-4432-8
Verlag: Springer Nature Singapore
Erscheinungstermin: 06.10.2017
Lieferfrist: bis zu 10 Tage

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage


Produkteigenschaften


  • Artikelnummer: 9789811044328
  • Medium: Buch
  • ISBN: 978-981-10-4432-8
  • Verlag: Springer Nature Singapore
  • Erscheinungstermin: 06.10.2017
  • Sprache(n): Englisch
  • Auflage: 1. Auflage 2018
  • Serie: SpringerBriefs in Applied Sciences and Technology
  • Produktform: Kartoniert
  • Gewicht: 2409 g
  • Seiten: 137
  • Format (B x H x T): 155 x 235 x 9 mm
  • Ausgabetyp: Kein, Unbekannt
Autoren/Hrsg.

Autoren

1. Introduction
2. Developments in field emission gun technologies and advanced detection systems
3. Advanced specimen preparation
a. Surface preparation
b. Surface cleaning
c. Charging compensation with ionic liquid treatment
4. Electron detection strategies for high resolution imaging: Deceleration and energy filtration
a. Principles
b. Application of dual in-lens electron detection
c. Energy filtration
5. Low voltage SEM
a. Strategy of characterization: deceleration and energy filtration
b. High resolution imaging
c. Low voltage, specimen charging and material contrast
d. Ultra-low voltage SEM: uses and limitations
6. Low voltage STEM in the SEM
7. X-ray imaging
a. X-ray imaging with a large solid angle annular silicon drift detector
b. Material science applications: Mapping at high resolution with high signal-to-noise ratio
c. The f-ratio method for quantitative x-ray analysis
8. Electron diffraction techniques in the SEM