Machines capable of automatic pattern recognition have many fascinating uses in science & engineering as well as in our daily lives. Algorithms for supervised classification, where one infers a decision boundary from a set of training examples, are at the core of this capability.
This book takes a close view of data complexity & its role in shaping the theories & techniques in different disciplines & asks:
- What is missing from current classification techniques?
- When the automatic classifiers are not perfect, is it a deficiency of the algorithms by design, or is it a difficulty intrinsic to the classification task?
- How do we know whether we have exploited to the fullest extent the knowledge embedded in the training data?
Uunique in its comprehensive coverage & multidisciplinary approach from various methodological & practical perspectives, researchers & practitioners will find this book an insightful reference to learn about current available techniques as well as application areas.
Produkteigenschaften
- Artikelnummer: 9781849965576
- Medium: Buch
- ISBN: 978-1-84996-557-6
- Verlag: Springer
- Erscheinungstermin: 22.10.2010
- Sprache(n): Englisch
- Auflage: 1. Auflage. Softcover version of original hardcover Auflage 2006
- Serie: Advanced Information and Knowledge Processing
- Produktform: Kartoniert, Previously published in hardcover
- Gewicht: 482 g
- Seiten: 300
- Format (B x H x T): 155 x 235 x 18 mm
- Ausgabetyp: Kein, Unbekannt
Themen
- Mathematik | Informatik
- EDV | Informatik
- Informatik
- Künstliche Intelligenz
- Mustererkennung, Biometrik
- Mathematik | Informatik
- EDV | Informatik
- Informatik
- Künstliche Intelligenz
- Wissensbasierte Systeme, Expertensysteme
- Mathematik | Informatik
- EDV | Informatik
- Programmierung | Softwareentwicklung
- Programmierung: Methoden und Allgemeines
- Mathematik | Informatik
- EDV | Informatik
- Programmierung | Softwareentwicklung
- Programmierung: Methoden und Allgemeines
- Mathematik | Informatik
- EDV | Informatik
- Informatik
- Künstliche Intelligenz
- Mustererkennung, Biometrik