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Defect Sizing Using Non-destructive Ultrasonic Testing

Applying Bandwidth-Dependent DAC and DGS Curves

Medium: Buch
ISBN: 978-3-319-81379-0
Verlag: Springer
Erscheinungstermin: 27.05.2018
Lieferfrist: bis zu 10 Tage

This book presents a precise approach for defect sizing using ultrasonics. It describes an alternative to the current European and American standards by neglecting their limitations. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. It introduces an improved method which provides a significant productivity gain and calculates curves with high accuracy. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.


Produkteigenschaften


  • Artikelnummer: 9783319813790
  • Medium: Buch
  • ISBN: 978-3-319-81379-0
  • Verlag: Springer
  • Erscheinungstermin: 27.05.2018
  • Sprache(n): Englisch
  • Auflage: Softcover Nachdruck of the original 1. Auflage 2016
  • Produktform: Kartoniert, Previously published in hardcover
  • Gewicht: 2175 g
  • Seiten: 118
  • Format (B x H): 155 x 235 mm
  • Ausgabetyp: Kein, Unbekannt
Autoren/Hrsg.

Autoren

Preface.- Sizing Methods: Distance Gain Size (DGS) and Distance Amplitude Correction (DAC).- A new approach to bring DGS and DAC close together.- Diagrams.- Perspectives.