Kostenloser Versand
Bequem zahlen
Wir sind gerne für Sie da
This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Produkteigenschaften
- Artikelnummer: 9783642057694
- Medium: Buch
- ISBN: 978-3-642-05769-4
- Verlag: Springer
- Erscheinungstermin: 01.12.2010
- Sprache(n): Englisch
- Auflage: 1. Auflage. Softcover version of original hardcover Auflage 2004
- Serie: Springer Tracts in Modern Physics
- Produktform: Kartoniert, Previously published in hardcover
- Gewicht: 335 g
- Seiten: 204
- Format (B x H x T): 155 x 235 x 12 mm
- Ausgabetyp: Kein, Unbekannt
Themen
- Technische Wissenschaften
- Elektronik | Nachrichtentechnik
- Elektronik
- Halb- und Supraleitertechnologie
- Technische Wissenschaften
- Maschinenbau | Werkstoffkunde
- Technische Mechanik | Werkstoffkunde
- Materialwissenschaft: Elektronik, Optik