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Schmidbauer

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Medium: Buch
ISBN: 978-3-642-05769-4
Verlag: Springer
Erscheinungstermin: 01.12.2010
Lieferfrist: bis zu 10 Tage

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.


Produkteigenschaften


  • Artikelnummer: 9783642057694
  • Medium: Buch
  • ISBN: 978-3-642-05769-4
  • Verlag: Springer
  • Erscheinungstermin: 01.12.2010
  • Sprache(n): Englisch
  • Auflage: 1. Auflage. Softcover version of original hardcover Auflage 2004
  • Serie: Springer Tracts in Modern Physics
  • Produktform: Kartoniert, Previously published in hardcover
  • Gewicht: 335 g
  • Seiten: 204
  • Format (B x H x T): 155 x 235 x 12 mm
  • Ausgabetyp: Kein, Unbekannt
Autoren/Hrsg.

Autoren

A Brief Introduction to the Topic.- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.